Microscopio elettronico a scansione (SEM)
Caratteristiche tecniche del Microscopio elettronico a scansione LEO 1430:
- High performance scanning electron microscope with Optibeam column control
- Large 3072 x 2304 image store with integrated noise reduction
- 5 axis motorised high precision geared stage in extra large chamber
- 3.5 nm resolution @ 30kV (tungsten)
- Tungsten firing unit
- 200V to 30kV accelerating voltage with automatic EHT bias
- Magnification range 15X to 300kX
- 3072 x 2304 pixel image store with square pixels
- Intuitive Windows™ Graphical User Interface with Windows NT® option